For more than 40 years, NI has developed automated test and automated measurement systems that help engineers solve the world’s toughest challenges. Let’s work together to find creative solutions to help your organization succeed today, tomorrow, and for the next 100 years.


Semiconductor test is a strategic focus area at NI, so we’re constantly listening to our customers. In doing so, we’ve discovered that chipmakers require new and disruptive approaches to semiconductor test. We also believe that now is the time to be bold in how we design, deploy, and maintain test systems.


We apply this same forward-thinking approach to semiconductor test. Our software-connected architecture accelerates commercialization from first silicon to high-volume production test; it features highly integrated modular hardware that enables systems to scale and evolve over time as requirements change. With it you can build and deploy test systems with R&D grade measurement quality to meet the operational requirements of the production floor.


If you’re anything like us, you’re probably wondering—what’s next for semiconductor? From 5G to optical sensing to autonomous driving, your industry plays a major role in shaping a better future for everyone. We’re excited to help you realize a tomorrow we can all believe in. Let’s make it happen.




Key Areas of Expertise

Enterprise Software

 With Nl’s software-connected approach, you can make data-driven decisions that deliver unprecedented manufacturing efficiency and product reliability.

RF Validation and Characterization

 Quickly characterize the latest wideband RF 5G devices with modular, fast, and accurate lab benches that integrate precision DC, digital, analog, and RF instrumentation.

Mixed-Signal Validation and Characterization

Reduce the cost of mixed-signal devices, ranging from data converters to power management and optoelectronics.


Wafer-Level Parametric Test

Nl’s parametric test solutions enable you to stay ahead of industry trends through massively parallel and flexible systems that can adapt and scale easily over time.

High-Volume Manufacturing Test

NI provides a smarter alternative to traditional automated test equipment (ATE) to meet cost and coverage requirements of increasingly complex RF and mixed-signal semiconductor devices.


Watch Our Video

Contact Person: Jason Ong

Sales Rep: [email protected]

Number: 6226 5886

Website: www.ni.com

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